Advances in Imaging and Electron Physics, Volume 62
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1984 | ISBN: 0120146622 | English | 318 pages | PDF | 16 MB
The articles in this volume of the Advances have a common theme, solid-state physics and materials science. Nevertheless, they are very different in detail, ranging from all aspects of spin-polarized electrons, through the role of deep impurities in semiconductors, to a contribution on the electron microscopy of materials. The latter has been the subject of a number of specialized monographs in recent years, but however complete monographs may be, they inevitably need to be supplemented at regular intervals by reviews such as that published here, especially in rapidly growing fields.
Contents
Spin-Polarized Electrons in Solid-State Physics
H. C. SIEGMANN, F. MEIER, M. ERBUDAK, and M. LANDOLT
Predictions of Deep-Impurity-Level Energies in Semiconductors
P. VOGL
Recent Advances in the Electron Microscopy of Materials
D. B. WILLIAMS and D. E. NEWBURY
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